Thiết bị kiểm tra bản mạch điện tử Hioki FA1817, FA1811, FA1283, FA1116

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Thiết bị kiểm tra bản mạch điện tử Hioki FA1817, FA1811, FA1283, FA1116

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Thiết bị kiểm tra bản mạch điện tử Hioki FA1817, FA1811, FA1283, FA1116

Double-sided Bare Board Inspection Tool | FLYING PROBE TESTER FA1817


FLYING PROBE TESTER   FA1817

Vertical type 4 arm double-sided inspection 
Open via defect detection with low resistance measurement

Double-sided Bare Board Inspection Tool | FLYING PROBE TESTER FA1817

 
• Vertical double-sided bare board inspection machine • Open via defect detection with low resistance measurement • Detect pattern shape abnormality and voids with super insulation resistance testing

FLYING PROBE TESTER FA1811

FLYING PROBE TESTER   FA1811

High precision contact 
in a space of square 10 μm.

FLYING PROBE TESTER FA1811

 
• Achieve both high precision contact and high-speed probing. • Double test method delivers an operation rate of 100%.

FLYING PROBE TESTER FA1283

FLYING PROBE TESTER   FA1283

Max.100 points/s ultra-high speed inspection
High-precision probing 15μm

FLYING PROBE TESTER FA1283

 
• Max.100 points/s ultra-high speed inspection • High-precision probing 15μm

Data Creation System for Bare Boards Testing | UA1781

FEB-LINE INSPECTION DATA CREATION SYSTEM   UA1781

1/2 Data Generation Time 
With New Platform

Data Creation System for Bare Boards Testing | UA1781

 
• 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half

FLYING PROBE TESTER FA1116-03

FLYING PROBE TESTER   FA1116

High-speed Testing at Up to 100 Points/sec. with Half the Impact Mark Depth

FLYING PROBE TESTER FA1116-03

 
• Reduced-impact link probes CP1072-01(option) • Laser height-adjustment Unit FA1950-06(option) • Reduced fine pattern test times • High-speed pattern testing using capacitance measurement


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