Máy đo độ dày lớp phủ Sanko SWT-7000Ⅲ+FN-325
The new dual probe FN-325 with auto (intelligent ) setting provides you with easy and simple operation： The probe FN-325 can be used with SWT-7000 Ⅲ series (7000Ⅲ, 7100Ⅲ, 7200Ⅲ) for measurements of both Fe and NFe metal substrates.
Optional SWT probes are interchangeable.
- Dual type : FN-325※
- For ferrous : Fe type
- For non-ferrous : NFe type
Specifications
Probe type : Dual FN-325 (exclusive for SWT-7000Ⅲ series)
Measuring method : Electromagnetic/Eddy current dual use
Measuring range : Ferrous：0～3.00mm, Nonferrous：0～2.50mm
Substrate detection : Automatic or manual switching
Display resolutions : 1μm：0～999μm
By switching,
0.1μm：0～400μm,
0.5μm：400～500μm,
0.01mm：（ferrous 1.00～3.00mm) , （nonferrous 1.00～2.50mm）
Accuracy (place the probe perpendicularly : Ferrous ＆nonferrous dual use to the flat face) 0～100μm：±1μｍ or ±2％ the read value
（ferrous）101μm～3.00mm：±2％
（nonferrous）101μm～2.50mm：±2％
Probe : One point contact constant pressure type, with V cut φ13×52mm, 72g
Option : V type probe adaptors (3 types: less Φ5, Φ5～10, Φ10～20 )
Accessories : Calibration standards (plastic foils)
Zero plate （ferrous, nonferrous dual）
Measuring objectives : Fe substrate: coating, lining, thermal spraying, plating on magnetic metal like iron, steel (except electrolyte nickel plating)
NFe substrate: insulated films on non-magnetic metal like aluminum, copper