Thiết bị kiểm tra mạch điện tử ESDEMC ES620 Compact TLP IV-Curve System
The ES620 Compact Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc…) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
Features:
- Most configurable TLP Pulsed IV-Curve System
- Ultra-Compact Design System
- Ultra-fast Speed with multi-thread processing
- Currently 25 A, 50 A,and 100 A models available
- High quality TLP pulses
- Test Function Expandable with vf-TLP, HMM, HBM, and LV-Surge options
- Automatic failure detection methods including:
DC Spot Check (V or I), Static IV, Fuse, Breakdown, Bias Source Fluctuation, and customization available
- Software controlled pulsing: Burst, Continuous, IV-Curve Characterization
- Rise-Time options from 60 ps to 50 ns *(depends on model)
- Pulse-Width options from 1 ns to 3200 ns *(depends on model)