Probe types |
F |
N |
Measuring methods |
magnetic induction |
eddy current |
Measuring range |
0 ~1250 μm |
0 ~1250 μm, 0 to 40μm(for chrome plate on copper) |
Minimum resolution |
0.1μm |
Tolerance |
Zero point calibration |
±(3%H+1)μm |
± (3%H+1.5)μm |
H means the thickness of tested piece |
Two points calibration |
±[(1~3)%H+1]μm |
±[(1~3)%H+1.5]μm |
H means the thickness of tested piece |
Measuring condition |
Min. curvature radius (mm) |
Convexity 1.5 |
Convexity 3 |
Min. testing area diameter (mm) |
Ø7 |
Ø5 |
Critical thickness of substrate(mm) |
0.5 |
0.3 |
Standards |
DIN,ISO,ASTM,BS |
Calibration |
Zero and foil calibration |
Interface |
USB2.0 |