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Model
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TS8210 portable benchtop spectrophotometer
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Optical Geometry
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D/8(diffused illumination, 8-degree viewing angle)
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SCI (specular component included)/SCE (specular component excluded) ; Include UV / excluded UV light source
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Comply to CIE No.15，GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7
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Characteristic
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Customized aperture,good for horizontal or vertical measurement, wider adaptability;
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Suitable for precise color measurement and quality control in textile and garment printing and dyeing, plastic electronics, ceramics and other industries;
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Integrating Sphere Size
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Φ40mm
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Light Source
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Combined full spectrum LED light source
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Spectrophotometric Mode
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Flat Grating
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Sensors
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Silicon photodiode array (double row 40 groups)
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Wavelength Range
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400~700nm
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Wavelength Interval
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10nm
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Semiband Width
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10nm
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Measured Reflectance Range
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0~200%
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Measuring Aperture
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Customized single aperture:MAV:Φ8mm/Φ10mm;SAV:Φ4mm/Φ5mm
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Specular Component
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SCI/SCE
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Color Space
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CIE LAB,XYZ,Yxy,LCh,CIE LUV,s-RGB,βxy,Munsell(C/2)
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Color Difference Formula
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ΔE*ab,ΔE*uv,ΔE*94,ΔE*cmc(2:1),ΔE*cmc(1:1),ΔE*00
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Other Colorimetric Index
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WI(ASTM E313,CIE/ISO,AATCC,Hunter)，
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YI(ASTM D1925,ASTM 313),
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Staining Fastness, Color Fastness, Color Strength, Opacity
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8° Glossiness,555 tone classification
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Observer Angle
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2°/10°
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Illuminant
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D65,A,C,D50,F2(CWF),F7(DLF),F10(TPL5),F11(TL84),F12(TL83/U30)
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Displayed Data
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Spectrogram/Values, Samples Chromaticity Values, Color Difference Values/Graph, PASS/FAIL Result, Color Simulation, Color Offset
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Measuring Time
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About 1.5s (Measure SCI & SCE about 3.2s)
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Repeatability
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Chromaticity value: MAV/SCI, within ΔE*ab 0.025 ( When a white calibration plate is measured 30 times at 5 second intervals after white calibration)
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Inter-instrument Error
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MAV/SCI, Within ΔE*ab 0.2
(Average for 12 BCRA Series II color tiles)
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Measurement Mode
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Single Measurement, Average Measurement(2-99times)
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Locating Method
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Camera Locating
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Dimension
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L*W*H=370X240X260mm
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