Thiết bị kiểm tra bản mạch điện tử Hioki FA1817, FA1811, FA1283, FA1116

Thiết bị kiểm tra bản mạch điện tử Hioki FA1817, FA1811, FA1283, FA1116

Thiết bị kiểm tra bản mạch điện tử Hioki FA1817, FA1811, FA1283, FA1116

	FLYING PROBE TESTER   FA1817 Vertical type 4 arm double-sided inspection  Open via defect detection with low resistance measurement   • Vertical double-sided bare board inspection machine • Open via defect detection with low resistance measurement • Detect pattern shape abnormality and voids with super insulation resistance testing
	FLYING PROBE TESTER   FA1811 High precision contact  in a space of square 10 μm.   • Achieve both high precision contact and high-speed probing. • Double test method delivers an operation rate of 100%.
	FLYING PROBE TESTER   FA1283 Max.100 points/s ultra-high speed inspection High-precision probing 15μm   • Max.100 points/s ultra-high speed inspection • High-precision probing 15μm
	FEB-LINE INSPECTION DATA CREATION SYSTEM   UA1781 1/2 Data Generation Time  With New Platform   • 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half
	FLYING PROBE TESTER   FA1116 High-speed Testing at Up to 100 Points/sec. with Half the Impact Mark Depth   • Reduced-impact link probes CP1072-01(option) • Laser height-adjustment Unit FA1950-06(option) • Reduced fine pattern test times • High-speed pattern testing using capacitance measurement