Thông tin sản phẩm
- DSF900 is a digital contour and roughness measuring instrument to achieve wide dynamic range measurements with high accuracy.
- Various parameters of surface roughness or waviness and various contour are analyzable.
- Z resolution / measuring range : 0.00075 μm / ±6 mm (0.0015 μm / ±12 mm)
- Z detection method : Semiconductor laser scale
- Stylus : R2 μm / 0.75 mN / 60° R25 μm / 10 mN / 25°
- Analysis item : Contour (element, scalar, statistics, master comparison, tolerance judge); Roughness (JIS, ISO, DIN, ANSI, BS); Waviness (JIS)