Thiết bị kiểm tra cuộn dây biến áp hãng Tonghui TH2829NX, TH2829CX, TH2829AX-48, TH2829AX-24, TH2829LX, TH2832XA, TH2832XB, TH2832XC

■ Number of Test PIN: 72/96/120/144/168/192

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

■ 7-inch TFT LCD display with a resolution of 800×RGB×480

■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

■ Diode forward and reverse characteristic detection

■ Improved high turns ratio and weakly coupled transformer

   test capability

■ Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

■ Sort the selected scanning parameters

■ Time stamping system: memory file setting, calibration 

   deviation and deduction time

■ Self-test scanning fixture relays

■ Flexible deviation deduction method

■ Multiple handling ways for FAIL cases

■ Single parameter test cycle to test independent windings

■ Increased security: administrator and operator passwords 

■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

■ Bar-code reading function can be used to select a setting file

   or to manage the type of test products

■ Optional PC-level instrument test setup file programming 

   capability

■ Online upgrade mode: USBHOST or RS232

■ Support multiple instrument networking through LAN 

   interface

■ Backward compatible with TH2818X/TH2819X parameter

   setting file

■ Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

■ Number of Test PIN: 20

■ Frequency: 20Hz-1MHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

■ 7-inch TFT LCD display with a resolution of 800×RGB×480

■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

■ Diode forward and reverse characteristic detection

■ Improved high turns ratio and weakly coupled transformer

   test capability

■ Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

■ Sort the selected scanning parameters

■ Time stamping system: memory file setting, calibration 

   deviation and deduction time

■ Self-test scanning fixture relays

■ Flexible deviation deduction method

■ Multiple handling ways for FAIL cases

■ Single parameter test cycle to test independent windings

■ Increased security: administrator and operator passwords 

■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

■ Bar-code reading function can be used to select a setting file

   or to manage the type of test products

■ Optional PC-level instrument test setup file programming 

   capability

■ Online upgrade mode: USBHOST or RS232

■ Support multiple instrument networking through LAN 

   interface

■ Backward compatible with TH2818X/TH2819X parameter

   setting file

■ Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

■ Number of Test PIN: 48

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

■ 7-inch TFT LCD display with a resolution of 800×RGB×480

■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

■ Diode forward and reverse characteristic detection

■ Improved high turns ratio and weakly coupled transformer

   test capability

■ Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

■ Sort the selected scanning parameters

■ Time stamping system: memory file setting, calibration 

   deviation and deduction time

■ Self-test scanning fixture relays

■ Flexible deviation deduction method

■ Multiple handling ways for FAIL cases

■ Single parameter test cycle to test independent windings

■ Increased security: administrator and operator passwords 

■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

■ Bar-code reading function can be used to select a setting file

   or to manage the type of test products

■ Optional PC-level instrument test setup file programming 

   capability

■ Online upgrade mode: USBHOST or RS232

■ Support multiple instrument networking through LAN 

   interface

■ Backward compatible with TH2818X/TH2819X parameter

   setting file

■ Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

■ Number of Test PIN: 24

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

■ 7-inch TFT LCD display with a resolution of 800×RGB×480

■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

■ Diode forward and reverse characteristic detection

■ Improved high turns ratio and weakly coupled transformer

   test capability

■ Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

■ Sort the selected scanning parameters

■ Time stamping system: memory file setting, calibration 

   deviation and deduction time

■ Self-test scanning fixture relays

■ Flexible deviation deduction method

■ Multiple handling ways for FAIL cases

■ Single parameter test cycle to test independent windings

■ Increased security: administrator and operator passwords 

■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

■ Bar-code reading function can be used to select a setting file

   or to manage the type of test products

■ Optional PC-level instrument test setup file programming 

   capability

■ Online upgrade mode: USBHOST or RS232

■ Support multiple instrument networking through LAN 

   interface

■ Backward compatible with TH2818X/TH2819X parameter

   setting file

■ Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

■ Number of Test PIN: 20

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

■ 7-inch TFT LCD display with a resolution of 800×RGB×480

■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

■ Diode forward and reverse characteristic detection

■ Improved high turns ratio and weakly coupled transformer

   test capability

■ Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

■ Sort the selected scanning parameters

■ Time stamping system: memory file setting, calibration 

   deviation and deduction time

■ Self-test scanning fixture relays

■ Flexible deviation deduction method

■ Multiple handling ways for FAIL cases

■ Single parameter test cycle to test independent windings

■ Increased security: administrator and operator passwords 

■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

■ Bar-code reading function can be used to select a setting file

   or to manage the type of test products

■ Optional PC-level instrument test setup file programming 

   capability

■ Online upgrade mode: USBHOST or RS232

■ Support multiple instrument networking through LAN 

   interface

■ Backward compatible with TH2818X/TH2819X parameter

   setting file

■ Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

■ Number of Test PIN: 20

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

■ 7-inch TFT LCD display with a resolution of 800×RGB×480

■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

■ Diode forward and reverse characteristic detection

■ Improved high turns ratio and weakly coupled transformer

   test capability

■ Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

■ Sort the selected scanning parameters

■ Time stamping system: memory file setting, calibration 

   deviation and deduction time

■ Self-test scanning fixture relays

■ Flexible deviation deduction method

■ Multiple handling ways for FAIL cases

■ Single parameter test cycle to test independent windings

■ Increased security: administrator and operator passwords 

■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

■ Bar-code reading function can be used to select a setting file

   or to manage the type of test products

■ Optional PC-level instrument test setup file programming 

   capability

■ Online upgrade mode: USBHOST or RS232

■ Support multiple instrument networking through LAN 

   interface

■ Backward compatible with TH2818X/TH2819X parameter

   setting file

■ Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

■ Number of Test PIN: 24

■ Frequency: 20Hz-200kHz, 15025 points

■ Signal Level: 10mV-2Vrms, 100μA—20mArms

                         20mV-1Vrms, 200μA—10mArms

■ Test Speed: max. 40ms

■ 4.3 inch TFT LCD Display

■ Brand new interface design

■ built-in 0 - ± 5V/50mA bias source

■ TH2832XA: LCR + transformer test system 

   TH2832XB: transformer test system

   TH2832XC: transformer test system

■ Discrete passive component (L, C, R) multipass scan test

■ Switch transformer scan test

■ Network transformer scan test

■ Relay drive coil, contact resistance multi-channle scan test

■ Multi-channel DCR scan test

■ Singel parameter loop test

■ Scan fixture relay action times review
■ Flexible deviation deduction method

■ Self-test scanning fixture relays

■ Storage: Internal: 100 groups of settings file to save

                    U disk: large capacity of configuration files, CSV 

                                format test data, and GIF format images

■  Firmware update through U disk

■ Optional PC-level instrument test setup file programming 

   capability

■ Parameter setting file is compatibe with TH 2829x-24

■ RS-232, USB DEVICE interface

■ Work with TH1831 24-pin transformer scanning fixture

■ Number of Test PIN: 24

■ Frequency: 20Hz-200kHz, 15025 points

■ Signal Level: 10mV-2Vrms, 100μA—20mArms

                         20mV-1Vrms, 200μA—10mArms

■ Test Speed: max. 40ms

■ 4.3 inch TFT LCD Display

■ Brand new interface design

■ built-in 0 - ± 5V/50mA bias source

■ TH2832XA: LCR + transformer test system 

   TH2832XB: transformer test system

   TH2832XC: transformer test system

■ Discrete passive component (L, C, R) multipass scan test

■ Switch transformer scan test

■ Network transformer scan test

■ Relay drive coil, contact resistance multi-channle scan test

■ Multi-channel DCR scan test

■ Singel parameter loop test

■ Scan fixture relay action times review
■ Flexible deviation deduction method

■ Self-test scanning fixture relays

■ Storage: Internal: 100 groups of settings file to save

                    U disk: large capacity of configuration files, CSV 

                                format test data, and GIF format images

■  Firmware update through U disk

■ Optional PC-level instrument test setup file programming 

   capability

■ Parameter setting file is compatibe with TH 2829x-24

■ RS-232, USB DEVICE interface

■ Work with TH1831 24-pin transformer scanning fixture

■ Number of Test PIN: 12

■ Frequency: 20Hz-200kHz, 15025 points

■ Signal Level: 10mV-2Vrms, 100μA—20mArms

                         20mV-1Vrms, 200μA—10mArms

■ Test Speed: max. 40ms

■ 4.3 inch TFT LCD Display

■ Brand new interface design

■ built-in 0 - ± 5V/50mA bias source

■ TH2832XA: LCR + transformer test system 

   TH2832XB: transformer test system

   TH2832XC: transformer test system

■ Discrete passive component (L, C, R) multipass scan test

■ Switch transformer scan test

■ Network transformer scan test

■ Relay drive coil, contact resistance multi-channle scan test

■ Multi-channel DCR scan test

■ Singel parameter loop test

■ Scan fixture relay action times review
■ Flexible deviation deduction method

■ Self-test scanning fixture relays

■ Storage: Internal: 100 groups of settings file to save

                    U disk: large capacity of configuration files, CSV 

                                format test data, and GIF format images

■  Firmware update through U disk

■ Optional PC-level instrument test setup file programming 

   capability

■ Parameter setting file is compatibe with TH 2829x-24

■ RS-232, USB DEVICE interface

■ Work with TH26080