| Short Term Repeatability - White |
0.1 DE*94 (D50, 2°) |
| Inter-Instrument Agreement |
Average 0.4 DE*94 (deviation from X-Rite manufacturing standard at a temperature of 23°C on 12 BCRA tiles (D50, 2°)) |
| Measurement Conditions |
M0, M1 & M2 |
| Minimal Media Thickness |
Typical 0.16mm, Range: 0.08 to 0.45mm |
| Photometric Range |
10 nm; Sampling interval 3.5 nm (100 bands) |
| Spectral Analyzer |
i1® technology (holographic diffraction grating with diode array) |
| Spectral Range |
380 - 730 nm |
| Spectral Reporting |
10 nm |
| Aperture |
Effective measurement aperture during scanning is depending on the patch size |
| Unit Color |
Silver/Black |
| Dimensions (length, width, height) |
Width 42 cm, depth 16 cm, height 12 cm (16.5 x 6.3 x 4.7 inches) |
| Weight |
3.2 kg (112.9 oz) |
| Communication Interface |
USB |
| Experience Level |
Intermediate to Advanced |
| Software Development Kit |
Available for OEM customers |
| Sheet Size |
A4+
Width: 6 to 23 cm (2.4 to 9 in.)
Length: 17 cm to 66 cm (6.7 to 26 in.) |
| Calibration |
Automatic on Internal Calibration Reference |